Theoretical development of the new approach is described in detail, which includes two linear regressions, \(\frac\), seeing details of the expressions in Eq. ( 10). Further increase in the stress only broadens the two LS peaks. In this paper, we propose a new approach to make simultaneous measurement of both residual normal and shear stresses. The peak separation between substrate and layer is related to the change of interplanar spacing normal to the substrate. The HMO samples were analyzed by X-ray diffraction, Fourier transform. In particular, the conventional method can only be applied to measure the residual normal stress while leaving the residual shear stress unknown. Toros Arda Aken, Bora ener, Emre Esener, Mehmet. A drawback of the conventional d ~ sin 2 ψ method is the increased uncertainty arising from sin 2 ψ splitting when a significant residual shear stress co-exists with a residual normal stress. A and the relevant angular data are summarized in Table A for. attenuators, filters, transducers and multiple state memory).X-ray diffraction has been widely used in measuring surface residual stresses. peak splitting attributed to the difference between K 1 and K 2 is clearly observed in Fig. The types of materials we investigate have potential applications in energy conversion, transparent conducting oxides, gas sensors, catalysts, low temperature co-fired ceramics, dielectric ceramics, solid oxide fuel cells, and electronics (e.g. There is a continual need for: 1) a better understanding of composition-structure-property relationships, 2) new compounds/materials with improved properties, and 3) more economical compounds/materials. The results of the research are presented at conferences and in publications. Group members learn about conducting literature searches and manuscript writing. For such deformations, high-resolution powder XRD using synchrotron radiation can be a more sensitive and reliable technique. Measurements of their chemical and properties are conducted using electrical and dielectric characterization as a function of temperature and atmosphere, magnetic measurements, and photocatalytic properties. In general, both single-crystal XRD and conventional electron diffraction (ED) techniques are not sensitive enough to small crystal deformations. Characterization of their resulting phase assemblages and crystal structures is conducted through the use of X-ray diffraction techniques and crystallography. Approaches for materials design and discovery include a target approach using structure prediction, a directed approach using chemical intuition and substitutions, and exploratory through phase diagram development. In our research laboratory we utilize various solid state synthesis methods including conventional high temperature (up to 1600 ℃), flux, solvothermal, sealed tube and gas flow reactions. My research group is interested in the synthesis and characterization of solid-state inorganic materials and in fundamental structure/property relationships of solid state oxides. Solid-State, Inorganic, Materials Chemistry National Research Council Postdoctoral Fellow, (2003-2004) National Institute of Standards and Technology,NIST, Gaithersburg, MD XRD data initially show peak shifting to lower 2 value, which indicates an expansion to a higher lattice parameter, then at the higher annealing temperature. of Chemistry and Biochemistry, University of South Carolina, Columbia, SC Inorganic Chemistry (1998-2002), Department of Chemistry, Ohio State UniversityĪssociate Professor (2010-present), Department of Chemistry, University of North Florida, Jacksonville, FLĪssistant Professor (2006-2010), Department of Chemistry, University of North Florida, Jacksonville, FL I then held a postdoctoral position with Professor Hanno zur Loye at the University of South Carolina, before starting at the University of North Florida.īS Chemistry (1994-1998), Department of Chemistry, Youngstown State University Following graduate school I spent two years as a National Research Council Postdoctoral Research Fellow at the National Institute of Standards and Technology in Gaithersburg MD, where I worked with Dr. Diffractometer measures the angles at which X-rays get reflected and thus get the structural information they contains. My research advisor was Professor Patrick Woodward and my research at that time focused experimental solid state chemistry and on the development of a software program ( SPuDS) to calculate the crystal structures of perovskites. The construction of a simple powder diffractometer was first described by Hull in 1917 1 which was shortly after the discovery of X-rays by Wilhelm Conrad Röntgen in 1895 2. I obtained a BS in Chemistry from Youngstown State University in 1998.
0 Comments
Leave a Reply. |